Japan, Jan. 16 -- FEI CO has got intellectual property rights for '3D MAPPING OF SAMPLE BY CHARGED-PARTICLE MICROSCOPY.' Other related details are as follows:
Application Number: JP,2021-198750
Category (FI): H01J37/18,H01J37/20@A,H01J37/22,502@L,H01J37/26
Stage: Grant (IP right granted following substantive examination.)
Filing Date: Dec. 7, 2021
Publication Date: June 20, 2022
The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100
Disclaimer: Curated by HT Syndication.
