Japan, June 10 -- KING YUAN ELECTRONICS CO LTD has got intellectual property rights for 'DYNAMIC BURN-IN TEST SYSTEM AND DYNAMIC BURN-IN TEST METHOD.' Other related details are as follows:
Application Number: JP,2024-169902
Category (FI): G01R31/30,G06F11/22,606@F,G01R31/27,G01R31/28@Y
Stage: Grant (IP right document published.)
Filing Date: Sept. 30, 2024
Publication Date: Nov. 26, 2025
The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100
Disclaimer: Curated by HT Syndication.
