Japan Intellectual Property Rights: DYNAMIC LIGHT SCATTERING MEASUREMENT DEVICE, DYNAMIC LIGHT SCATTERING MEASUREMENT ANALYSIS METHOD, AND MEASUREMENT PROGRAM

Japan, Jan. 23 -- NATIONAL INSTITUTE FOR MATERIALS SCIENCE has got intellectual property rights for 'DYNAMIC LIGHT SCATTERING MEASUREMENT DEVICE, DYNAMIC LIGHT SCATTERING MEASUREMENT ANALYSIS METHOD, AND MEASUREMENT PROGRAM.' Other related details are as follows:

Application Number: JP,2022-002138

Category (FI): G01N21/65,G01N15/0205,G01N15/02@A

Stage: Grant (IP right granted following substantive examination.)

Filing Date: Jan. 11, 2022

Publication Date: Dec. 13, 2022

The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100

Disclaimer: Curated by HT Syndication.