Japan, Nov. 11 -- JEOL LTD has got intellectual property rights for 'ELECTRON MICROSCOPE AND CALIBRATION METHOD.' Other related details are as follows:
Application Number: JP,2023-132919
Category (FI): H01J37/26,H01J37/22,501@G,H01J37/22,501@Z
Stage: Grant (IP right granted following substantive examination.)
Filing Date: Aug. 17, 2023
Publication Date: Feb. 28
The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100
Disclaimer: Curated by HT Syndication.
