Japan, May 18 -- V TEX:KK has got intellectual property rights for 'FAILURE DIAGNOSIS METHOD FOR VACUUM VALVE DEVICE.' Other related details are as follows:
Application Number: JP,2023-049678
Category (FI): G01H17/00@Z,F16K37/00@M,G01M99/00@Z,G01M13/003
Stage: Grant (IP right granted following substantive examination.)
Filing Date: March 27, 2023
Publication Date: Oct. 9, 2024
The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100
Disclaimer: Curated by HT Syndication.
