Japan, Jan. 21 -- QUALTEC:KK has got intellectual property rights for 'FILM THICKNESS MEASURING DEVICE AND FILM THICKNESS MEASURING METHOD.' Other related details are as follows:
Application Number: JP,2022-040386
Category (FI): G01B21/08,G01B7/06@A,G01N27/28,301@Z,G01N27/416,341@M,G01N27/27@C,G01B11/06@Z
Stage: Grant (IP right document published.)
Filing Date: March 15, 2022
Publication Date: Sept. 28, 2023
The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100
Disclaimer: Curated by HT Syndication.
