Japan, Oct. 30 -- ARKRAY INC has got intellectual property rights for 'MEASUREMENT SYSTEM, AND MEASUREMENT METHOD.' Other related details are as follows:
Application Number: JP,2022-168628
Category (FI): G01N21/78@A,G01N33/543,501@Z
Stage: Grant (IP right granted following substantive examination.)
Filing Date: Oct. 20, 2022
Publication Date: May 7, 2024
The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100
Disclaimer: Curated by HT Syndication.
