Japan, June 10 -- HIOKI EE CORP has got intellectual property rights for 'MEASURING APPARATUS, MEASURING METHOD, AND PROGRAM.' Other related details are as follows:
Application Number: JP,2025-115037
Category (FI): G01R31/12@A,G01R31/34@D
Stage: Grant (IP right document published.)
Filing Date: July 8, 2025
Publication Date: Sept. 4, 2025
The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100
Disclaimer: Curated by HT Syndication.
