Japan, Feb. 27 -- HITACHI LTD has got intellectual property rights for 'SECONDARY BATTERY STATE DIAGNOSING METHOD AND STATE DIAGNOSING DEVICE.' Other related details are as follows:
Application Number: JP,2022-045353
Category (FI): G01R31/392,G01R31/389,G01R31/3842,G01R31/3828,H01M10/42@P,H01M10/48@P,H02J7/00@Q,H02J7/00,H02J7/80,H02J7/84
Stage: PROBLEM TO BE SOLVED: To provide a secondary battery state diagnosing method and a secondary battery state diagnosing device with which it is possible to diagnose a secondary battery or per-electrode degradation, even when an active material is used for electrodes of the secondary battery whose change of potential does not precisely correspond to a change of charge state.SOLUTION: Provided is a state diagnosis method for diagnosing the degradation state of a secondary battery, wherein a relationship of the charge state and open-circuit voltage of the secondary battery, and a relationship group composed of relationships of the charge state and internal resistance of the secondary battery for each of mutually different energization times are taken as input information, and the degradation state of the secondary battery, the degradation state of positive electrodes and the degradation state of negative electrodes are taken as output information. The secondary battery state diagnosing device takes, as input information, data that indicates a relationship of the charge state and open-circuit voltage of the secondary battery, and data that indicates a relationship group composed of relationships of the charge state and internal resistance of the secondary battery for each of mutual different energization times, and takes, as output information, data that indicates the degradation state of the secondary battery, data that indicates the degradation state of positive electrodes, and data that indicates the degradation of negative electrodes.SELECTED DRAWING: Figure 2 (Grant)
Filing Date: March 22, 2022
Publication Date: Oct. 4, 2023
The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100
Disclaimer: Curated by HT Syndication.
