Japan, Jan. 20 -- SYSMEX CORP has got intellectual property rights for 'SPECIMEN MEASUREMENT METHOD, CARTRIDGE, AND SPECIMEN MEASUREMENT DEVICE.' Other related details are as follows:
Application Number: JP,2021-213753
Category (FI): G01N35/02@D
Stage: Grant (IP right granted following substantive examination.)
Filing Date: Dec. 28, 2021
Publication Date: July 10, 2023
The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100
Disclaimer: Curated by HT Syndication.
