Japan, Nov. 4 -- CHROMA ATE INC has got intellectual property rights for 'WAFER THICKNESS MEASUREMENT SYSTEM AND MEASUREMENT PLATFORM THEREOF.' Other related details are as follows:
Application Number: JP,2025-075970
Category (FI): G01B21/08,H10P74/20@P,H01L21/66@P
Stage: Grant (IP right granted following substantive examination.)
Filing Date: May 1, 2025
Publication Date: Dec. 18, 2025
The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100
Disclaimer: Curated by HT Syndication.
