Japan, June 10 -- RIGAKU CORP has got intellectual property rights for 'X-RAY DIFFRACTION DEVICE, AND MEASUREMENT METHOD.' Other related details are as follows:
Application Number: JP,2025-081442
Category (FI): G01N23/20008,G01N23/207
Stage: Grant (IP right document published.)
Filing Date: May 14, 2025
Publication Date: Aug. 5, 2025
The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100
Disclaimer: Curated by HT Syndication.
